View Latest Version
Home
| Company Profile
| Factory
| Warehouse
| Brochure
| Showroom
| Inventory
| Contact Us
ATMEGA32L8AU, H&T Electronics Co., Ltd - Inventory
H & T have strict supplier control criteria, only purchase from franchised
distributors or reliable suppliers.
Strict inspection and test before shipment:
Documentation and Packaging Inspection
100% External visual inspection under microscope
X-ray Fluorescence (XRF)
Heated Solvent Test
Decapsulation and Die Analysis
Electrical Test
Test site available for customerized test.
Proper packi...
Unit Price in USD
| Part Number |
Description |
Brand |
Qty |
Unit Price |
D/C |
Delivery |
Remarks |
| ATMEGA32L-8AU |
44LTQFP10x10 |
MICROCHIP |
525 |
|
20+ |
|
|
| ATMEGA48PA-AU |
32LTQFP7X7 |
MICROCHIP |
2708 |
|
20+ |
|
|
| ATMEGA48PA-AU |
TQFP32 |
MICROCHIP |
10000 |
|
21 |
|
|
| ATMEGA64-16AU |
64LTQFP14X14 |
MICROCHIP |
3647 |
|
20+ |
|
|
| ATMEGA64-16AU |
TQFP |
MICROCHIP |
300 |
|
2017 |
|
|
| ATMEGA64-16MU |
64LVQFN9x9 |
MICROCHIP |
1149 |
|
202120 |
|
|
| ATMEGA644P-20AQ |
TQFP10x10 |
MICROCHIP |
21508 |
|
2020+ |
|
|
| ATMEGA644P-20AQR |
TQFP10x10 |
MICROCHIP |
21509 |
|
2020+ |
|
|
| ATMEGA644P-20AU |
TQFP10x10 |
MICROCHIP |
21510 |
|
2020+ |
|
|
| ATMEGA644P-20AUR |
TQFP10x10 |
MICROCHIP |
21511 |
|
2020+ |
|
|
| ATMEGA644P-20MQ |
VQFN7x7 |
MICROCHIP |
21512 |
|
2020+ |
|
|
| ATMEGA644P-20MQR |
VQFN7x7 |
MICROCHIP |
21513 |
|
2020+ |
|
|
| ATMEGA644P-20MU |
VQFN7x7 |
MICROCHIP |
21514 |
|
2020+ |
|
|
| ATMEGA644P-20MUR |
VQFN7x7 |
MICROCHIP |
21515 |
|
2020+ |
|
|
| ATMEGA644P-20PQ |
PDIP |
MICROCHIP |
21516 |
|
2020+ |
|
|
| ATMEGA644P-20PU |
PDIP |
MICROCHIP |
21517 |
|
2020+ |
|
|
| ATMEGA644PV-10AU |
44LTQFP10x10 |
MICROCHIP |
5051 |
|
17+ |
|
|
| ATMEGA644PV-10MU |
44LVQFN7x7 |
MICROCHIP |
800 |
|
202120 |
|
|
| ATMEGA645-16AU |
TQFP14x14 |
MICROCHIP |
21553 |
|
2020+ |
|
|
| ATMEGA645-16AUR |
TQFP14x14 |
MICROCHIP |
21554 |
|
2020+ |
|
|
Inventory Index:
1 2 3 4 5 6 7 8 9 10
[HKINEP]
Copyright © 2019 Hong Kong Inventory Limited. All Rights Reserved.